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Fogale Wafer Thickness Testing Equipment

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KINGYOUP ENTERPRISES CO., LTD.
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Key Features

Patented optical head, with the wavelength IR1310 probe, non-contact way to accurately measure the measured object position and thickness. Combined with coaxial IR and white light microscope, with the wavelength IR1310 probe, the observation point is the measurement point, the implementation of programming faster. Depending on the customer's needs, it is also possible to provide fully automated machines with a maximum measurable size of 2 "wafers. Can be used with a perspective and reflection IR light source, increase the infrared observation function. Can be installed sensor for thin film and product surface 3D profile measurement.

Last Update : 2017-10-17
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Ms.Grace Lin , KINGYOUP ENTERPRISES CO., LTD.

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